Current Development of Ion Deflectometry in Z-Pinch Plasmas

Ion deflectometry is a diagnostic method for measuring electric and magnetic fields. It is used in high energy density plasmas but can also probe vacuum environments. Studied fields deflect trajectories of probing ion beams, and the measured ion displacements correspond to the line integrals of the deflecting fields. Ion deflectometry/radiography is widely used in laser-produced plasmas, but its development in z-pinches was difficult due to an unavailable source of MeV ion beams. We developed a unique way of utilizing a multi-MeV deuteron source for z-pinch-driven ion deflectometry. Current and B-field measurements were performed successfully on a 3-MA z-pinch. In order to extend the applicability of the ion deflectometry, MeV ion sources were investigated on other sub-MA devices in the configurations of the plasma focus and hybrid x-pinch.