Accuracy of hemispherical far-field patterns determined from near-field measurements

This paper reports on the accuracy of far-field patterns determined from near-field measurements on a 499 element C-band phased array antenna. Hemispherical far-field patterns were determined from near-field measurements and principle plane cuts of these patterns were compared to the same cuts made on a farfield range. Comparisons are sheen for both the sum and azimuth difference patterns for three scan positions of the phased array.