Parameter optimization of deterministic dynamic element matching DACs for accurate and cost-effective ADC testing

Deterministic dynamic element matching (DDEM) is applied to low accuracy DACs for high resolution ADC test. The testing accuracy is impressive while the test cost is relatively low. This work tries to further optimize the DDEM parameters based on improving the test accuracy and reducing the test hardware and computation cost. The optimization is accomplished by theoretical analysis and numerical simulation. Some typical parameter values are suggested by this work.