High power operation of electroabsorption modulators

In this paper we characterize temperature distribution in an electroabsorption modulator. A self-consistent opto-electro-thermal model is developed that accurately predicts thermal runaway in unoptimized EAM structures. Optimized structures with improved thermal design achieve high power operation with a record damage free power dissipation level in excess of 300 mW. In conclusion, using a thermoreflectance imaging technique, surface temperature measurement of active electroabsorption modulators is acquired.