VCSEL based parallel optical interconnect reliability

Reliability of parallel optical interconnects (POI) is very critical because of the high cost of system down time. The high reliability standards established for telecom applications are even more challenging in a twelve wide array form factor. From a reliability viewpoint the limiting components are the optoelectronic devices. Reliability of the devices in the Gore nLIGHTEN/sup TM/ POI module is reviewed with emphasis being placed on the VCSEL transmitters.