Crystalline Structure and Surface Morphology of CdTe Thin Films

In this article, we present main results and problems related to growth of CdTe thin films by pulsed laser deposition (PLD), describe the main structural and morphological properties of grown films and discuss the promising features of the material for designing electronic and optoelectronic devices. The crystal structure of grown samples was measured by x-ray diffraction (XRD), transmission electron diffraction (TEM), the surface morphology and roughness was analyzed by atomic force microscopy (AFM).