Development of a millimeter wave magnetic resonance force microscopy probe

X-band probe for magnetic resonance force microscopy (MRFM) has been developed, and the instrumental characteristics have been estimated. For the examination of the system, we have performed the MRFM experiments on a few nanogram 1,1-diphenyl-2-picrylhydrazyl (DPPH) sample mounted on a cantilever. It has been shown that the system has a signal sensitivity of 10/sup 6//spl mu//sub B/ and a spatial resolution of a few /spl mu/m.