Observation of lithium drifted silicon detectors using SEM

Sectional surfaces of the lithium-drifted silicon detector are observed using the scanning electron microscope (SEM). Cyclic striation lines are observed in the lithium-drifted region of a detector made from a large-diameter silicon ingot. This is confirmed to be due to a cyclic fluctuation of donor impurity caused by a cyclic change of temperature during floating-zone processing. These materials are judged to be unsuitable for detector application.<
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