Low-return Loss Design of PCB Probe-to-Microstrip Transition for Frequencies up to 150 GHz

For the measurement of devices mounted on printed circuit boards (PCBs), suitable interfaces are required. Conventional PCB coaxial connectors require a significant handling time to be fixed on a PCB. In addition, they cannot be used for automated testing of multiple devices. On-wafer probing solutions offer superior performance and are easy to automate. This paper presents a methodological approach for designing low-return loss PCB coplanar-to-microstrip transition pads that can be probed with commercial on-wafer probing solutions. We show measurements demonstrating a return loss of better than 15 dB up to 150 GHz. These results agree with electromagnetic (EM) simulation.