Magnetic properties of RF sputtered NbO-Ni and NiO-Nb multilayer thin films: Application of Preisach model

In the present study, (NiO)-niobium (Nb)/ niobium oxide (NbO)- nickel (Ni) bilayer structure was prepared by using Radio Frequency (RF) magnetron sputtering technique. The sub-layers were deposited successively on glass substrate. The magnetic properties of the prepared samples were carried out at room temperature in both perpendicular and parallel magnetic field to the sample. The Preisach model was used to fit the magnetic behavior of the developed NiO-Nb/NbO-Ni bilayer thin films. XRD measurements were performed to assess the structural properties of the elaborated thin-films. It is found that the obtained results correlates well with the experimental ones, were a good agreement between the experimental data and the theoretical modeling is recorded. Therefore, the obtained results indicate the effectiveness of the proposed methodology based on experiments assisted by accurate modeling approaches and provides a sound pathway for developing potential alternative materials for sensing and spintronics applications.