A Loss Tangent Measurement Surface for Free Space Focused Beam Characterization of Low-Loss Dielectrics

The precise characterization of the complex permittivity, particularly loss tangent, in low-loss dielectric samples at microwave frequencies usually employs resonant cavity methods, where the quality factor of some resonance is determined by a precisely dimensioned sample of the material placed inside the cavity. In this work, a hybrid resonance/transmission approach is investigated whereby a highly resonant periodic array attached to a dielectric sample is measured in a broadband focused beam system. A frequency selective surface (FSS) is designed to be placed against a planar dielectric sample to create a transmission or reflection response that is sensitive to the loss tangent of the material under test. This sandwiched structure is illuminated by the focused beam system to approximate plane-wave-like incidence, and scattering parameters measured. It is shown that the magnitude of response at the resonant frequency is linearly dependent on the loss tangent of the material under test for a certain range of loss tangents, and sources of error that limit sensitivity at lower loss tangents are explored.