In Orbit Programming and SEE characterization of the Microchip RT PolarFire® FPGA Fabric

Microchip Radiation Tolerant (RT) PolarFire Field Programmable Gate Array (FPGA) fabric in orbit programming is investigated using Total Ionizing Dose (TID), Proton and Heavy ion in beam programming tests. In beam programming results show that in orbit programming can be achieved and programming must be followed by stand-alone verify to ensure programming success. Single Event Effect (SEE) characterization of the FPGA Fabric and Single Event Latchup (SEL) using heavy ion and proton are also presented.