Concepts for high throughput LED testing using high-speed optical transients of LEDs

To extract parameter sets for Spice-like multi-domain models of LEDs needs appropriate set of input data, including forward current - flux, and forward current -forward voltage characteristics of LED packages, performed under isothermal conditions at known values of the junction temperature also known as isothermal IVL characterization, along with the dynamic thermal properties of the LED package in question. The optical and thermal laboratory test procedures, if properly combined, may provide the right set of test data, if both the forward current and the junction temperature are swept over the foreseen operating domain of the LED package to be modelled. The major bottleneck however is, that the industry standard laboratory test procedures (both the optical and thermal ones) require reaching the operating steady state before the actual data acquisition can start, resulting in an impedingly long measurement time. The goal of the present work is to provide an overview of the options of speeding up the overall measurement procedure or the average throughput of the tests for a LED population that provides a representative set of data for multi-domain modelling.