B-H Curve Tracing by Magnetic Contact Force

This paper proposes a B-H curve tracing method for material by magnetic contact force. In general, material data used in electrical devices are measured by the Epstein frame and VSM. However, the Epstein frame is difficult to measure in the high magnetic field area, and the VSM is expensive. The proposed method in this paper tracks the magnetic flux density and magnetic field strength inside the sample by measuring the force of the magnetic contact force sensor. Low-cost miniaturization is possible in a new way that is different from the existing method. The proposed method is explained in principle through a simple model and demonstrated through simulation.