Work-in-Progress: High-Precision Short-Term Lifetime Prediction in TLC 3D NAND Flash Memory as Hot-data Storage

In this paper, read disturb (RD) at various program/erase (P/E) stages has been thoroughly explored, and short-term lifetime prediction models of RD and endurance are proposed. Based on these, a new short-term warning system (STWS) is proposed, which can extend the lifetime of 3D NAND-based storage by adjusting LDPC codes dynamically. The experimental result shows that the proposed prediction models have high reliabilities, and STWS can effectively prolong the lifetime of NAND flash.