Fast Identification of Laser Array Damage Points Based on Wavelet Transform

A laser induced array damage testing point identification method based on wavelet transform is proposed for rapid measurement of laser induced damage threshold (LIDT). The experimental setup is built, the 4×4 array testing beam is split by Dammann grating from 1064 nm laser, and then, the array testing point’s image on the surface of optical film is captured by CCD camera. Through carrying out correlation operation, the damage information accurately is obtained through wavelet decomposition and wavelet reconstruction. Under the precondition of ensuring the accuracy, the testing period of the laser induced array damage testing point identification method based on wavelet transform is greatly reduced. In order to verify the reliability of the method, the proportional microscope method specified in ISO11254 international standard is used to detect the same sample, and the results show that the two test methods have a good consistency.