Structure, chemical composition, and Raman characterisation of CdZnTeSe thick polycrystalline films

In this work, thick polycrystalline CdZnTeSe films with different concentrations of components were deposited by the close-spaced sublimation. The chemical composition and Raman spectra of obtained films were investigated. The surface morphology and structural properties were studied in order to determine the crystalline quality of the films. It was determined that close-spaced sublimation allows to obtain high-quality CdZnTeSe thick films with Zn concentration up to 3 at. %, and Se concentration up to 1.5 at. %, with can be used as a material for X-ray and gamma-ray detectors.