Broadband Second Harmonic Generation using Surface Roughness Induced Random Quasi Phase Matching in Zinc Telluride slab

In this paper, the influence of surface roughness on second harmonic broadband formation in mid-IR area is described analytically by utilizing total internal reflection-quasi phase matching (TIR-QPM) method, using Random Quasi Phase Matching (RQPM) in reverse tapered orientation, made of Zinc Telluride (ZnTe) semiconductor slab. A computer-aided simulation of a ZnTe slab, after accounting for scattering as a result of reflection and surface roughness, revealed a 3-dB bandwidth of 210.39 nm centered at 10.8 μm and having efficiency of peak conversion as 4.2 percent. The effect of operating temperature, crystal length and thickness variation on the work is being studied.