LDMS Darshan Connector: For Run Time Diagnosis of HPC Application I/O Performance

Periodic capture of comprehensive, usable I/O performance data for scientific applications requires an easy-to-use technique to record information throughout the execution without causing substantial performance effects. In this paper, we introduce a unique framework that provides low latency monitoring of I/O event data during run time. We implement a system-level infrastructure that continuously collects I/O application data from an existing I/O characterization tool to enable insights into the I/O application behavior and the components affecting it through analyses and visualizations. In this effort, we evaluate our framework by analyzing sampled I/O data captured from two HPC benchmark applications to understand the I/O behavior during the execution life of the applications. The result shows the utility of capturing I/O application performance and behavior.