Fragmented High-Energy Heavy-Ion Beams for Electronics Testing

Fragmented heavy-ion beams obtained from the interaction of highly energetic ions with thick targets relative to the ion ranges are proposed to mimic the high-penetration linear energy transfer (LET) spectrum present in space and for electronics testing. Our experimental data characterizing fragmented heavy-ion beams show an excellent level of agreement with the Monte Carlo simulations, serving as an initial proof-of-concept of the proposed single-event effect (SEE) testing approach.