Design of a High-Dynamic Test Bench for Accelerated Dielectric Lifetime Testing with Adjustable Voltage Slopes and Temperatures

Upcoming future mobility will require high power densities; therefore, wide bandgap semiconductors (WBGs) and HVDC supply voltage could be one solution. One crucial design criterion is the insulation coordination in all drive train components. This paper presents and discusses a test bench design to emulate dielectric stress due to fast switching and hard switching WBGs at high voltages and various environmental conditions.