Analysis of Recombination Dynamics in Solar Cells by Generation-Decay Time Maps

A new method of representation based on the generation-decay time (GDT) maps is presented to estimate the recombination dynamic behavior in solar cells. The method quantitively describes the open circuit voltage transients versus carrier density dependence. An accurate estimation of recombination dynamics through GDT maps enables more easily identifying the dominant recombination processes. Moreover, the method provides deeper insight on the consistent interpretation of recombination order and ideality factor.