A Method of Embedded Computer Degradation Trend Prediction

During the product life cycle, electronic systems in aerospace equipment often experience different working states such as storage, testing, and power-on. It is of great significance for maintenance personnel to monitor the health status of electronic systems in time to study the degradation trend analysis based on key parameters of embedded computers. This paper collects data on key parameters of embedded computers during temperature-accelerated aging and evaluates real-time input data at normal working temperatures. The degradation curve of the component under storage conditions is calculated from the high temperature test data using the acceleration factor. We use the real input data under storage to update the acceleration factor and reasonably estimate its current degradation trend. This approach provides a technical means for the development of a new generation of computer health management.