On-Chip Nano Pulse Test Element Group for Analysis of Synaptic Devices

In this paper, on-chip pulse test element groups (TEGs) were proposed to evaluate the main characteristics of synaptic devices as a function of pulse width and height, especially in nanosecond region. On-chip generation of nanosecond level pulses are highly necessary to evaluate the dependence of synaptic device characteristics on the pulse width and pulse height, because the increase or decrease of current/conductance of synaptic device is a key for neuromorphic application. We demonstrated the performance and the application of the TEGs by integrating and measuring memristors on these TEGs.