Developing Methods for Combinational Circuit Generation

This article provides an overview of the current state of research in the field of reliability of combinational circuits. The developed methods for combinational circuits generation and their subsequent implementation in the form of software are described. The implemented algorithms were used to generate combinational circuits in the structured Verilog format; the circuits generated were converted to circuits using the Nangate open standard cell library. For schemes, their parameters were calculated and stored in a structured form for subsequent conversion into a dataset in csv format. Using the developed software, a dataset of combinational circuits was generated; it can be used to conduct research on predicting the reliability of combinational circuits based on limited information about them. The dataset generated was tested using two machine learning methods.