System-on-Chip approach millimeter-wave imaging development for fusion plasma diagnostics

Millimeter-wave “System-on-Chip” technology has been employed in chip heterodyne diagnostics systems for fusion plasma measurements, including radiometers, reflectometers, interferometers, etc. The SoC technology has brought a dramatic advance in microwave imaging instruments. We are currently developing wide bandgap GaN chips, which support long-term fusion plasma parameter measurements in radiation harsh environments.