Nonlinear Loss and Damage Threshold in Silicon Photonic Waveguides: Modelling and Experimental Verification

Nonlinear losses of integrated waveguides are crucial for many applications. We develop and experimentally verify a quantitative model for two-photon absorption (TPA), subsequent free-carrier absorption (FCA), and damage thresholds of silicon photonic waveguides under pulsed and continuous-wave (CW) operation.