Microwave dielectric properties and high frequency dielectric characteristic of Cu2+/ Zn2+ co-substitution CaMgSi2O6 ceramics

In this work, Cu
²⁺
/ Zn
²⁺
co-substitution ceramics Ca(Cu
1/2
Zn
1/2
)
x
Mg
1–x
Si
2
O
6
(0 ≤ x ≤ 0.025) were prepared via the traditional solid phase reaction method. Cu
²⁺
and Zn
²⁺
ions occupied the position of Mg
²⁺
, resulting in a change in the crystal structure. In-depth discussion was had regarding the effects of co-substitution of Cu
²⁺
and Zn
²⁺
on dielectric properties. XRD diffraction pattern indicated that pure phase CaMgSi
2
O
6
ceramics were obtained at x=0.02. Rietveld refinement results showed crystal structure information. A solid solution of Cu
²⁺
/ Zn
²⁺
was formed inside the crystal lattice. Appropriate $\text{Cu}_{1/2}\text{Zn}_{1/2}^{2+}$ ions promoted sintering and grain growth. Density had a great effect on ε
r
. Regarding the Q × f values, the external loss was crucial. The τ
f
was associated with MgO
6
octahedral distortion. Additionally, The optimal microwave dielectric properties were achieved by sintered CaMg
0.98
(Cu
1/2
Zn
1/2
)
0.02
Si
2
O
6
ceramics at 1200
^◦
C : ε
r
= 7.997, Q × f = 45107 GHz, τ
f
= −42.52 ppm/°C In the terahertz range, the ceramic had decent dielectric properties: ε
r
= 5.28, tanδ = 0.125.