The dependence of reliability on raw material in BME-MLCCs

Base metal electrodes (BME)-multilayer ceramic capacitors (MLCCs) with high volume capacitance are considered to be a fascinating device for a diverse range of electrical applications. Here, the influence of raw materials on the microstructure, tetragonality, dielectric properties and reliability are systematically analyzed FESEM, micro-XRD, temperature coefficient of capacitance (TCC) curves, Weibull distribution of breakdown voltage (BDV) and highly accelerated life test (HALT). It is found that the BaTiO
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powder with uniform particle size distribution is beneficial for inhibiting the grain growth of BaTiO
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ceramics, further suppressing the grain size of dielectric layers, which would increase the permittivity-temperature stability of MLCCs. Especially, the ultra-thin MLCCs with smaller grain size demonstrates a higher breakdown voltage and longer failure time. This work demonstrates a strategy to trigger a method which can effectively improve the reliability and dielectric characteristics of BME-MLCCs.