An Industry Example to Reduce the Test Time by Optimizing Data Extration Method

Test time reduction(TTR) is one of critical steps for test engineers to reduce the running cost in Semiconductor Probe. The test time is highly influenced by the test program, such as the program logic and methodology. This paper presents an industry example to reduce the test time by optimizing the data extraction method through changing the VB code on a volume automotive IC product with stringent quality requirements. Based on the experiment result, there is a tremendous test time reduction opportunity available through the data extract method.