A Calculating Method for the Distance and Included Angles between Lattices in the Electronic Microscopic Image based on the Gaussian Fitting

The processing of electron microscopic image has very important research value and practical significance. In this paper, a method to calculate the lattice distance and included angle based on Gaussian fitting is proposed. In this method, the atomic positions in the electron microscopic image are measured by Gaussian fitting, and The average values of lattice distances and included angles in different directions are calculated. The experimental results show that this method has good results in the determination of atomic position and the calculation of lattice distance and included angle, and greatly improves the calculation efficiency of related parameters.