Feasible Extraction Method for Electromagnetic Properties of Multilayer Metamaterials With Short-Circuit Termination

An extraction technique is proposed for electromagnetic characterization of metal-backed multilayer metamaterial (MM) structures demonstrating reflection-asymmetric property. It uses recursive scattering parameters for direct and reversed configurations of a multilayer structure. The algorithm was validated by comparing the extracted electromagnetic properties of multilayer structures composed of different MM unit cells with those determined by one-layer-only S-parameter methods. Two-layer and three-layer multilayer structures composed of MM slabs with C-shaped and
$\Omega $
-shaped rings and an FR4 material were fabricated and measured for experimental validation. A sensitivity analysis was also conducted to quantitatively evaluate the performance of our method against a small air gap between the multilayer structures and the short-circuit termination and between adjacent MM slabs within these structures. Strong agreement was observed between the resulted obtained using our method and measurements.