Precise Fault Injection and Fault Location System for SRAM-based FPGAs

When SRAM-based FPGAs are used in aerospace electronic systems, they are susceptible to single-event upsets (SEUs) effect. As a result, the function of the device can be changed easily or even the device itself is damaged in the space radiation environment. Therefore, it is necessary to develop a tool to evaluate the SEUs effect. In this paper, a resource-based precise fault injection and fault location system is developed for SRAM-based FPGA. The system performs fault injection for all or part of the resources used by the user-designed module, and evaluates the sensitivity of each resource through fault location. The fault injection and fault location processes are introduced respectively, and the formula for converting the coordinates of tile resources into frame information is summarized. Experiments on the Virtex-7 device XC7VX330T show that our system can effectively evaluate the SEUs effect and give the distribution of sensitive resources.