Experimental Study of Transient Dose Rate Effect on System-in-Package SZ0501

This article investigates the transient dose rate effect (TDRE) on the system-in-package (SiP) SZ0501 experimentally. A specialized program is designed for TDRE tests. With the increase of dose rates, the failure features of the SiP are recorded. Photocurrents on each power supply line are also measured to assist in analyzing SiP failures. In addition, both enabled and disabled programmable read-only memory (PROM) cases are considered to compare their discrepancies. The experimental results show that high frequency (HF) signals in the SiP are much sensitive to TDRE. Also, the logical resource in its field-programmable gate array (FPGA) presents a higher sensitivity than the clock resource, which is a contrary finding to the previous results. Besides, it is found that there seems to be a micro latch-up window in the SiP. Moreover, this SiP demonstrates different TDRE for enabled PROM and disabled PROM cases, and it has an automatic reconfiguration process in the case of enabled PROM. These findings are followed by a detailed analysis and discussion.