A 3D Vertical-Channel Ferroelectric/Anti-Ferroelectric FET With Indium Oxide

A vertical channel ferroelectric-FET (FeFET) with HfO
₂
-based ferroelectric (Fe-HfO
₂
) and atomic layer deposition (ALD) Indium oxide (InOx) channel has been developed and demonstrated for 3D high-density memory applications. Reliable memory operation has been confirmed with memory window (MW) >1V in gate length (L
_g
) = 50nm short channel FeFETs. Polar-axis transition of Fe-HfO
₂
from in- plane in the initial film to out-of-plane after electrical cycling has been verified by both experimental and theoretical studies. A vertical channel anti-ferroelectric (AFe) FET (AFeFET) with ZrO
₂
has been also demonstrated by making use of half-loop hysteresis in AFe, which can be a new solution for the weak erase problem seen in oxide semiconductor channel FeFETs.