Design and implementation of error detection and correction system for semiconductor memory applications

VLSI RAM chips build memories in all modern computers. Hence, these devices are highly reliable and can last for decades before a single chip fails. While combining many chips in a single memory, more time is taken to operate. When binary data is written into the memory, the presence of defective chips causes errors. This paper implements the error correction and detection system design for semiconductor memory applications. The primary intent of this paper is to detect and correct errors in an effective way. As a result, the reliability and speed of operation will be increased efficiently.