Frequency Chirp Characterization of Silicon Ring Resonator Modulators

The frequency chirping properties of silicon ring resonator modulators (RRMs) are experimentally investigated under sinusoidal modulation. The modulated electric field at the output of an RRM is measured in the time domain thanks to a coherent detection system. The power and phase waveforms are then analyzed in terms of their temporal phase and amplitude for different wavelength detunings between the optical source and the resonance and for different modulation frequencies. The evolution of the frequency chirp, described through a peak-to-peak chirp parameter, is quantified as a function of wavelength detuning and modulation frequency for the first time.