Transient Extraction Transform Based Fault Location Method with Enhanced Accuracy

The fast determination of internal or external fault for the VSC-MTDC is essential for its safety and continuous operation. As very limited time is permitted in an internal fault, transient-based protection elements are widely applied to locate the fault in a very small-time window. However, with such a short time window, location methods based on the wavelet transform or the mathematical morphology show limited performance balancing the resolution in the time and frequency do-mains. In recent years, there has been a novel time-frequency domain analysis method, naming the transient extraction trans-form (TET), with high accuracy in both domains. In this paper, a TET-based fast fault-location method is proposed with enhanced accuracy. Comparison studies are made to highlight the performance of such a method against internal faults for the VSC-MTDC.