Prediction Method of the Breakdown Probability for Multiple Vacuum Gaps in Series Considering Dielectric Recovery Under a Lightning Impulse Voltage

The objective of this article is to propose a novel prediction method of the breakdown (BD) probability for multiple vacuum gaps (VGs) in series considering their dielectric recovery under a lightning impulse voltage. Based on the experimental data of the BD probability for each single VG and the calculated voltage distribution of multiple VGs, the BD probability of multiple VGs in series could be calculated by the proposed prediction method. By dielectric tests under the lightning impulse voltage, we see that the calculated BD probability distributions fit well with the experimental results for double VGs and triple VGs in series. Under sphere–plane electrode VGs, the prediction error was approximately 15% in the whole range of BD probabilities. The errors of the 50% BD voltage were 11.4% and 12.9% for double VGs and triple VGs in series, respectively. Therefore, the reliability of this prediction method considering the dielectric recovery was validated. This prediction method could be used to estimate the dielectric strength of multibreak vacuum circuit breaker (VCB) and multiple floating shields inside high-voltage vacuum interrupters.