Quantifying Measurement Uncertainty of Microwave Amplifiers with Very Low Noise Figures Designed by Multi-Objective Optimization

Best properties of low noise amplifiers in RF design can only be achieved by the multi-objective optimization, which enables a compromise between the transducer power gain and noise figure in some shape of Pareto front. However, as the final circuit constructed in this way is not fully matched at the output, measuring the amplifier - unmatched neither to transducer power gain nor to noise figure - is quite complicated, especially in the case of the very low noise figures. Although we have recently suggested a measurement method for such circuits, it can be principally affected by the tolerances of the equipment. In this paper, we propose quite accurate estimation of these tolerances.