Simple and ultrafast automatic bias control for optical IQ modulators enabled by dither vector mapping monitoring | IEEE Conference Publication | IEEE Xplore

Simple and ultrafast automatic bias control for optical IQ modulators enabled by dither vector mapping monitoring


Abstract:

A simple and ultrafast automatic bias control for optical IQ modulators is proposed using dither-vector-mapping monitoring. It is verified in 40/20Gbaud 16/64QAM signal t...Show More

Abstract:

A simple and ultrafast automatic bias control for optical IQ modulators is proposed using dither-vector-mapping monitoring. It is verified in 40/20Gbaud 16/64QAM signal transmissions, and the tracking time (0.3~0.5s) is 30-times faster than commercial products.
Date of Conference: 06-10 March 2022
Date Added to IEEE Xplore: 13 April 2022
ISBN Information:
Conference Location: San Diego, CA, USA

Contact IEEE to Subscribe

References

References is not available for this document.