Abstract:
We present a novel scalable wafer screening method that guarantees an optical damage threshold larger than +5 dBm for 28 GBd long wavelength avalanche photodiodes over la...Show MoreMetadata
Abstract:
We present a novel scalable wafer screening method that guarantees an optical damage threshold larger than +5 dBm for 28 GBd long wavelength avalanche photodiodes over large-scale production volumes. © 2022 The Author(s)
Date of Conference: 06-10 March 2022
Date Added to IEEE Xplore: 13 April 2022
ISBN Information:
Conference Location: San Diego, CA, USA
Contents 