Total Ionizing Dose Characterization of Microchip Programmable Current Limiting Power Switch LX7712

The total ionizing dose (TID) characterization results of the Microchip radiation hardened programmable current limiting power switch IC, the LX7712, are presented. The performance after 100krad(Si) TID is determined to be good and comparable to pre-irradiation data. Some shifts were observed on some parameters only, however, none of these will impact materially the system-level performance.