Modeling the temperature noisy performance of low-noise III-V microwave devices down to cryogenic levels

We performed research work on the effects of temperature by investigating the, DC behavior, the small signal and the noise performance of HEMT and HBT at microwave frequencies by means of different experimental systems down to cryogenic levels. The measurement data were then employed to extract temperature-dependent noisy models to be implemented in commercial CAD software. Here we report the results of the modeling procedure with a special concern for the noise performance whose knowledge is of primary importance in the design of ultra high sensitivity receivers.