High Resolution Spintronics Probe-Array Technology Solutions for Very Near-Field Scanning

New integrated high-resolution Spintronics Probe-Array at nanometric and micronic scales are proposed for very-near field (VNF) scanning and OTA-testing of electronic circuits and radiating systems. The proposed technology solutions lead to small dimensions (micrometric range), reduced cost, and high magnetic field sensitivity at room temperature with tunability through smart-adaptive-biasing control. The measured performances exhibit improvements in terms of accuracy and thermal stability outperforming state of the art sensors based on SQUID techniques, Josephson junctions or loops-based technologies. Porting of chemically functionalized Spintronics into advanced FD-SOI platforms is proposed as an enabler of hybrid interferometric Thermal-Electromagnetic sensing based on unified analog-digital image-correlators using ASIC-System on a Chip (ASIC-SoC) integration solutions.