Novel low cost launch for measuring via-to-cavity coupling | IEEE Conference Publication | IEEE Xplore

Novel low cost launch for measuring via-to-cavity coupling


Abstract:

In order to isolate the effect of coupling between a signal via and a PCB or package cavity a novel launch setup is described and analyzed. This low cost launch consists ...Show More

Abstract:

In order to isolate the effect of coupling between a signal via and a PCB or package cavity a novel launch setup is described and analyzed. This low cost launch consists of using a 0.35$ USD SMA connectors soldered as surface mount to each side of a signal via. Use of hot glue melt provides mechanical stability and reduces impedance discontinuity. The proposed setup measures the true effect of how a via excites a cavity without perturbing the cavity.
Date of Conference: 13-15 December 2021
Date Added to IEEE Xplore: 27 December 2021
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Conference Location: Urbana, IL, USA

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