Design of Aging Test System for SiC MOSFET Modules

Power devices have been widely used in power electronic converters in various applications, such as new energy power generation, electric vehicle charging stations and motor drives. Among power devices, SiC MOSFETs are gaining significant attention and gradually entering the market due to their high speed, high temperature and high power characteristics, but their long-term reliability still remains a top concern. The power cycling test is the most effective and important aging test for device reliability assessment. This paper presents a versatile and energy-saving dual three-phase bridge power cycling aging test system for SiC Modules. It includes the circuit topology, control strategy, heat dissipation design. High-voltage R
DS_ON
measurement circuit is described in detail, which monitors all power devices' turn-on resistance in real time for health assessment. A 300kW system is designed and tests are conducted to validate the feasibility and effectiveness of the proposed system under different conditions.