Measurement based amplifier design

In this paper, the development of a turnkey, multi-functional measurement system is described. It is electronically reconfigurable and allows for the on-wafer design of an amplifier to a given specification. All primary amplifier measurements can be completed such as S-parameters, minimum noise figure, source/load pull, harmonic power and intermodulation. In addition, real time voltage/current waveforms of the amplifier can be monitored and dynamic loadlines produced. The requirement for more linear amplifiers has also been addressed in this paper with the low frequency feedback technique being implemented for the first time on MOS technology and on-wafer.