An Automated Multi-Device Characterization System for Reliability Assessment of Power Semiconductors

In this paper, an automated setup is proposed for reliability studies which can characterize multiple power semiconductor devices simultaneously. A multi-channel test board is implemented to realize large-scale device characterization based on a conventional device characterization system. A LabVIEW virtual instrument (VI) is built as a state machine consisting of a measurement control program to achieve automated device switching and characterization. To verify the proposed hardware design's accuracy and consistency, repeated parameter measurements are conducted on the same SiC MOSFETs for error analysis. The measurement of critical parameters, such as leakage current, threshold voltage, and onresistance, are validated experimentally. The results show that the proposed system enables power devices characterization with high accuracy and consistency.