Structural and composition of Cu-doped ZnTe thin films with different concentrations by immersion in Cu(NO3)2 solution

Undoped and Cu-doped ZnTe thin films were deposited on the glass substrate by closed space sublimation (CSS) technique. The deposited films were immersed in Cu(NO
3
)
2
solution with concentration varying from 4.2•10
^-3
mol/l to 10.5•10
^-3
mol/l. X-ray diffraction (XRD) patterns of undoped and Cu-doped ZnTe thin films exhibited polycrystalline behavior with highest sharp peak corresponding to (111) direction as a preferred orientation. The oxidation states of Zn
²⁺
, Te
²⁺
, Te
^2-
, and Cu
²⁺
through high-resolution X-ray photoelectron spectroscopy (XPS) analyses were revealed.